Recent Publications

    • Sept. 2016: X Chen, P Lin, K Zhang, H Baumgart, B Geist, V Kochergin, “Seebeck Coefficient Enhancement of ALD PbTe/PbSe Nanolaminate Structures Deposited inside Porous Silicon” ECS Journal of Solid State Science and Technology 5 (9), P503-P508 (2016)
    • Dec. 2015: Brian Geist, Reginald Ronningen, Andreas Stolz, Robert C Duckworth, Thomas E Blue, Georg Bollen, and Vladimir Kochergin, “Radiation Hard Terbium Gallium Garnet (TGG) Based Magnetic Field Sensor,” Presented to the Fall 2015 MRS Meeting, Boston, MA
    • Dec. 2015: Brian Geist, Jue Wang, Madrakhim Zaynetdinov, Hans D Robinson, Scott Huxtable, and Vladimir Kochergin, “High Figure of Merit Bismuth Doped PbSe/PbTe Superlattice Three Dimensional Structures,” Presented to the Fall 2015 MRS Meeting, Boston, MA
    • Oct. 2015: X. Chen (Applied Research Center, Old Dominion University), P. Lin (Old Dominion University, Applied Research Center), K. Zhang (Applied Research Center), H. Baumgart (Applied Research Center, Old Dominion University), B. Geist (MicroXact Inc.), and V. Kochergin (MicroXact Inc.), “Seebeck Coefficient Measurement of Pbsete / PbTe Nanolaminate Structures,” Invited talk, 228th ECS Meeting, Phoenix, AZ
    • Jul. 2015: L. Gao, B. Hoskins, M. Zaynetdinov, V. Kochergin, and D. Strukov, “The effect of Ti and O ion implantation on the resistive switching in Pt/TiO2-x/Pt devices,” Applied Physics A 120, pp.1599-1603
    • Mar. 2015: Results of joint work by MicroXact and Michigan State has been published in Applied Optics: B. Geist, R. Ronningen, A. Stolz, G. Bollen, and V. Kochergin, “Radiation stability of visible and near-infrared optical and magneto-optical properties of terbium gallium garnet crystals,” Appl. Opt. 54, 2866-2869 (2015).
    • Mar. 2015: Results of joint work by MicroXact, Virginia Tech and Jefferson National Labs has been published in IEEE Sensors: Madrakhim Zaynetdinov, Erich M. See, Brian Geist, Gianluigi Ciovati, Hans D. Robinson, and Vladimir Kochergin, “A Fiber Bragg Grating temperature sensor for 2 K to 400 K.”
    • Dec. 2014: Results of joint work by MicroXact and UCSB will be presented at 2014 MRS Fall Meeting (November 30 – December 5, 2014): Brian Geist, Dmitri Strukov, Vladimir Kochergin, “Experimental and Theoretical Investigation of Minimization of Forming-Induced Variability in Resistive Memory Devices.”
    • Dec. 2014: Results of joint work by MicroXact and Virginia Tech will be presented at 2014 MRS Fall Meeting (November 30 – December 5, 2014): Brian Geist, Madrakhim Zaynetdinov, Kirby Myers, Hans D Robinson, Vladimir Kochergin, “Thermal rectification of porous semiconductor materials.”
    • Dec. 2014: Results of joint work by MicroXact, Virginia Tech and ODU will be presented at 2014 MRS Fall Meeting (November 30 – December 5, 2014): Brian Geist, K. Zhang, A. D. Ramalingom Pillai, X. Chen, H. Baumgart, Madrakhim Zaynetdinov, Kirby Myers, Hans D Robinson, Vladimir Kochergin, “Advanced Materials and Devices for Thermoelectric Energy Conversion.”
    • Oct. 2014: Results of joint work by MicroXact and ODU will be presented at 2014 ECS and SMEQ Joint International Meeting (October 5-10, 2014) (Electronic Materials and Processing): K. Zhang, A. D. Ramalingom Pillai, X. Chen, H. Baumgart, and V. Kochergin, “ALD Synthesis of PbSe Thin Films inside Porous Si Templates for Innovative Thermoelectric Applications.”
    • Oct. 2014: Results of joint work by MicroXact and ODU will be presented at 2014 ECS and SMEQ Joint International Meeting (October 5-10, 2014): Xin Chen, Kai Zhang, A. D. Ramalingom Pillai, Helmut Baumgart, Vladimir Kochergin, “ALD Synthesis of Ternary PbSeTe Layers Alternating with the Binary PbTe in Nanolaminate Structures for High ZT Thermoelectric Materials.”
    • Jun. 2014: Results of joint work by MicroXact, ODU and Karlsruhe Institute of Technology were published in Physica Status Solidi A, Volume 211, Issue 6, pages 1329–1333: K. Zhang, A. D. Ramalingom Pillai, M. Tangirala, D. Nminibapiel, K. Bollenbach, W. Cao, H. Baumgart, V. S. K. Chakravadhanula, C. Kübel and V. Kochergin, “Synthesis and characterization of PbTe thin films by atomic layer deposition.”
    • May 2014: Results of joint work by MicroXact, ODU, Helmholtz Institute Ulm and Karlsruhe Institute of Technology were published in ECS Journal of Solid State Science and Technology, 3(6) P207-P212 (2014): K. Zhang, A. D. Ramalingom Pillai, K. Bollenbach,D. Nminibapiel, W. Cao, H. Baumgart, V. S. K. Chakravadhanula, C. Kübel and V. Kochergin, “Atomic Layer Deposition of Nanolaminate Structures of Alternating PbTe and PbSe Thermoelectric Films.”
    • Feb. 2014: Results of joint work by MicroXact, ODU, Helmholtz Institute Ulm and Karlsruhe Institute of Technology were published in ECS Journal of Solid State Science and Technology, 3 (4) P95-P100 (2014): David Nminibapiel, Kai Zhang, Madhavi Tangirala, Helmut Baumgart, V. S. K. Chakravadhanula, Christian Kubel, and Vladimir Kochergin, “Growth of Nanolaminates of Thermoelectric Bi2Te3/Sb2Te3 by Atomic Layer Deposition.”
    • Jan. 2014: Results of joint work by MicroXact and Virginia Tech were published in the Journal of Materials Science 01/2014; 49(1). DOI: 10.1007/s10853-013-7716-8: Lauren A. Neely, Vladimir Kochergin, Erich M. See and Hans D. Robinson, “Negative thermal expansion in a zirconium tungstate/epoxy composite at low temperatures.”
    • Oct. 29, 2013: US Patent 8,569,740 “High efficiency thermoelectric materials and devices” by V. Kochergin was issued.
    • Aug. 6, 2013: US Patent 8,501,621 “Method of fabrication of the memristive device” by V. Kochergin was issued
    • Oct. 2013: Results of joint work by MicroXact, ODU and Karlsruhe Institute of Technology were presented at 224th ECS Meeting in San Francisco, California (October 27-November 1, 2013): K.Zhang, A.D.R. Pillai, D. Nminibapiel, M. Tangirala, V. Chakravadhanula, C. Kübel, H. Baumgart, V. Kochergin, “ALD Growth of PbTe and PbSe Superlattices for Thermoelectric Applications.”
    • Oct. 2013: Results of joint work by MicroXact, ODU and Karlsruhe Institute of Technology were presented at 224th ECS Meeting in San Francisco, California (October 27-November 1, 2013): K. Zhang, D. Nminibapiel, M. Tangirala, V. Chakravadhanula, C. Kübel, H. Baumgart, V. Kochergin, “Microstructure Analysis of ALD Bi2Te3/Sb2Te3 Thermoelectric Nanolaminates.”
    • Oct. 2013: Results of joint work by ODU, Karlsruhe Institute of Technology and MicroXact were presented at 24th ECS Meeting (October 27 – November 1, 2013): K Zhang, D. Nminibapiel, M. Tangirala, V.S.K. Chakravadhanula, C. Kübel, H. Baumgart, V. Kochergin, “Microstructure Analysis of ALD Bi2Te3/Sb2Te3 Thermoelectric Nanolaminates .”
    • Oct. 2013: Results of joint work by ODU and MicroXact were presented at 24th ECS Meeting (October 27 – November 1, 2013): K Zhang, A.D.R. Pillai D. Nminibapiel, M. Tangirala, V.S.K. Chakravadhanula, C. Kübel, H. Baumgart, V. Kochergin, “ALD Growth of PbTe and PbSe Superlattices for Thermoelectric Applications.”
    • Aug. 2013: Results of joint work of MicroXact and UCLA were presented at Plasmonics: Metallic Nanostructures and Their Optical Properties XI, SPIE Optics + Photonics symposium 25 – 29 August 2013, San Diego, CA: V. Kochergin, S. Cherepov, R. Schwartz, L. Neely, K. Flanagan, I.N. Krivorotov, E.V. Kochergin, K.L. Wang, Ultrafast all-optical magnetization reversal in GdFeCo films around plasmonic nanostructures.
    • Aug. 2013: Results of joint work by Karlsruhe Institute of Technology, Old Dominion University and MicroXact Inc. were presented at Microscopy Conference 2013 in Regensburg, Germany, August 25–30, 2013: V.S.K. Chakravadhanula, C. Kübel, K. Zhang, D. Nminibapiel, M. Tangirala, H. Baumgart, V. Kochergin, “TEM Investigation of Bi2Te3/Sb2Te3 Nanolaminate Structures Synthesized by Atomic Layer Deposition.”
    • June 2013: Results of joint work by UCSB and MicroXact were presented at the 55th Electronic Materials Conference, at the University of Notre Dame, June 26-28, 2013: L. Gao, B. Hoskins, L.A. Neely, V. Kochergin, and D. Strukov, “The Effect of Ion Implantation on the Resistive Switching in Pt/TiO2-x/Pt Devices.”
    • May 2013: Results of joint work by ODU and MicroXact were presented at E-MRS Spring Meeting, Strassbourg, Germany: K. Zhang, A.R. Pillai, D. Nminibapiel, M. Tangirala, V.S.K. Chakravadhanula, C. Kübel, H. Baumgart, V. Kochergin, “ALD Growth of PbTe Thin Films for Thermoelectric Applications.”
    • May 2013: Results of joint work by ODU and MicroXact were presented at E-MRS Spring Meeting, Strassbourg, Germany: K Zhang, D. Nminibapiel, M. Tangirala, V.S.K. Chakravadhanula, C. Kübel, H. Baumgart, V. Kochergin, “TEM Investigation of Bi2Te3/Sb2Te3 Nanolaminate Structures Synthesized by Atomic Layer Deposition.”
    • Nov. 6, 2012: US Patent 8,303,176 “Cryongenic Fiber Optic Temperature Sensor and Method of Manufacturing the Same” by V. Kochergin.
    • Oct. 2012: Results of joint work by MicroXact, ODU and Virginia Tech were presented at The Electrochemical Society Fall Meeting, Pacific Rim Meeting, Atomic Layer Deposition Applications Symposium, Honolulu, Hawaii, Oct 7 -12, 2012: K. Zhang, D. Nminibapiel, M. Tangirala, H. Baumgart, V. Kochergin, “Fabrication of Sb2Te3 and Bi2Te3 multilayer composite films by Atomic Layer Deposition.”
    • July 2012: Results of work by MicroXact and Westinghouse were presented at International Boiling Water Reactor and Pressurized Water Reactor Materials Reliability Conference and Exhibition July 16–19, 2012, National Harbor, Maryland USA: V. Kochergin, J. Spanner, F. Garner “Measuring Void Swelling with an Ultrasonic Tomography Technique.”
    • July 2012: Results of joint work by MicroXact and Virginia Tech were published: L. A. Neely, E. See, H. D. Robinson, V. Kochergin, “Thermal expansion of Cu(II)O nano- and micro-particles and composites at cryogenic temperatures,” Phys. Stat. Sol. (b) (2012) doi: 10.1002/pssb.201248121
    • June 2012: Results of joint work by MicroXact, ODU and Virginia Tech were presented at the American Vacuum Society ALD 2012 & BALD 2012 Conference in Dresden, Germany: D. Nminibapiel,, K. Zhang, M. Tangirala, H. Baumgart, V. Kochergin, “The Role of Interface Adhesion in ALD Growth of Sb2Te3 from (Me3Si)2Te and SbCl3 Precursors.”
    • March 2012: Results of joint work by MicroXact, JLab and Virginia Tech were presented at the APS Meeting, February 27-March 2, 2012, abstract #D24.001: E. See, V. Kochergin, L. Neely, M. Zaynetdinov, G. Ciovati, H. Robinson, “Zirconium tungstate/epoxy resin nanocomposites with negative coefficient of thermal expansion for all-dielectric cryogenic temperature sensors.”
    • March 2012: Results of joint work by MicroXact, ODU and Virginia Tech were be presented at the Minerals, Metals and Materials Society Spring Meeting in Orlando, Florida: M. A. Mamun, D. Gu, D. Nminibapiel, H. Baumgart, H. Robinson, V. Kochergin, and A. A. Elmustafa, Nanomechanical properties of atomic layer deposition Sb2Te3 thin films.
    • Nov. 2011:  Results of joint work by MicroXact, ODU and Virginia Tech were presented at the Cambridge NanoTech ALD Fall Retreat 2011 in Georgia Institute of Technology, Atlanta, Georgia: D. Nminibapiel, D. Gu, H. Baumgart, H. Robinson and V. Kochergin, “Atomic Layer Deposition of Antimony Telluride thin Films using (Me3Si)2Te with SbCl3 as Precursors.”
    • Oct. 2011: Results of joint work of MicroXact, Jlab and Virginia Tech were presented at 78th Annual Meeting of the Southeastern Section of the APS: E. See, V. Kochergin, L. Neely, M. Zaynetdinov, G. Ciovati and H. Robinson, “Negative coefficient of thermal expansion in (epoxy resin)/(zirconium tungstate) nanocomposites”
    • Oct. 2011: Results of joint work of MicroXact, ODU and Virginia Tech were published: D. Gu, D. Nminibapiela, H. Baumgart, H. Robinson, and V. Kochergin, “Atomic Layer Deposition of Antimony Telluride Thin Films using (Me3Si)2Te with SbCl3 as Precursors” ECS Transactions, 41 (2) 255-261 (2011)
    • Oct. 2011: Dr. Robinson (Virginia Tech) presented the results of joint work by MicroXact and Virginia Tech at IEEE Photonics Society annual meeting in Arlington, Virginia in October.
    • Aug. 2011: Results of joint work of MicroXact and UCLA were published: V. Kochergin, L.N. Neely, L.J. Allin, E.V. Kochergin, K.L. Wang, Plasmonic enhancement of ultrafast all-optical magnetization reversal, Proc. SPIE, Vol. 8096, pp. 80960Q (2011).
    • Aug. 2011: Results of joint work of MicroXact and Virginia Tech were published: V. Kochergin, L. Neely, S. Wi, Ch.-Y. Jao, H. Robinson, Aluminum nanoparticles for improved OPV devices, Proc. SPIE 8111, 811117 (2011).
    • May 2011: Result of joint work by MicroXact, Virginia Tech and Sundew Technologies were published: H.D. Robinson, O. Sneh and V. Kochergin (2011). Nanostructured Telluride Films on Macroporous Silicon for High Efficiency Thermoelectric Devices. MRS Proceedings, 1314 , mrsf10-1314-ll05-14 doi:10.1557/opl.2011.510
    • March 2011: The results joint work of MicroXact and Virginia Tech were published: V. Kochergin, L. Neely, C.-Y. Jao, and H. D. Robinson, “Aluminum plasmonic nanostructures for improved absorption in organic photovoltaic devices”, Appl. Phys. Lett. 98, 133305 (2011). The paper was selected for Virt. J. Nanosci. Technol. 23(25).

 

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