The Models CPS-XXX-CF-PLUS enables fast and cost-effective testing of wafers and devices at cryogenic temperatures down to 9K (single CCR system), 4.5K (dual CCR system) or even below 4K (triple CCR system).
The Models CPS-HT give the opportunity of testing devices at highest temperatures on the market either in vacuum or in controlled gas environment.
The MPS-C-300 and MPS-C-350 systems are the world’s first probe stations capable of immersing a full size wafer in a fully controllable three-dimensional magnetic field.
The Models SPS-2600-PLUS-VAC and 2800-PLUS-VAC offer precise, cost-efficient and convenient probing in vacuum or in controlled gas atmosphere.
The Model CPS-CF enables cost effective, stable, reliable and convenient cryogenic testing of devices and circuits at very low temperatures.
MicroXact’s cryomagnetic probe stations are available with electromagnets, superconducting magnets or combination of electromagnet and superconducting magnet.
MicroXact has a history of working with customers to develop application-specific and highly customized probing solutions to meet ever-evolving needs. We are dedicated to finding solutions that help lower your cost of testing.