XactTest Probe Station Automation Software Solution

The automated systems are driven by MicroXact’s XactTest ™ probe station software developed in-house and refined through collaboration with customers. The Interface is designed to be simple yet powerful, allowing users to easily set up an automated testing procedure for nearly any kind of device. The LabView-based XactTest software solution is logically structured and allows for probe station control and easy integration of the customer’s own test and measurement equipment.

XactTest Probe Station Software Features

  • In most cases, all automation, measurement and data acquisition can be managed by the software package running on a simple laptop computer.
  • No expensive hardware needed.
  • Software allows user to generate a wafer map of the devices and then save the map to be imported later.
  • Map editing feature also lets users quickly and easily mark specific die or regions of a wafer that they want tester of skipped.
  • Point-and-click navigation lets user click on map to quickly move probes to a specific device on the wafer.
  • Software-assisted alignment corrects for mechanical misalignment of wafer and will correct for thickness variation across a wafer.
  • Full control of the thermal chuck and light shutter are built into the software permitting complex and highly customizable testing sequences.
  • Extensive SCPI command library for probe station control and integration with auxiliary test and measurement equipment.
  • MicroXact team works diligently with customers to develop the best possible automation solutions as quickly as possible.