Product
MicroXact is pleased to be able to provide the industry’s finest in RF probes. We are offering a wide rage of RF Probes:
All microscopes include a viewport for cameras. We offer compatible scope-mount digital cameras ranging from 1 megapixel to 10 megapixels. Included with the camera is software for image and video capture as well as dimension measurement capability.
We offer shielding systems compatible with all MicroXact standard probe stations (SPS models). The shielding systems are designed to protect the sample or wafer from EMI and RFI during testing.
The SPS-1000, SPS-2000, and SPS-2200 systems are MicroXact’s premier manual probe stations designed to be flexible and easy to use. The high level of performance and affordability of these manual probe systems put them in a class of their own. With up to 200mm wafer capabilities, DC or RF probes and optional thermal chuck, and […]
The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers. As […]
The automated systems are driven by MicroXact’s XactTest™ probe station software. The Interface is designed to be simple and convenient, allowing users to easily set up an automated testing procedure for nearly any kind of device. The LabView-based XactTest software solution is logically structured and allows for probe station control and easy integration of the […]
The LCS-4000 Probe Station with Integrated Laser Cutting System gives the user maximum flexibility in semiconductor diagnostic cutting, failure analysis, trimming, marking and topside layer removal. All of these functions can be performed on a microscopic level, all on this one system, which provides a high level of performance that is remarkably easy to use. […]
The A4P-Series Wafer Resistivity Mappers use proven industry standards to provide fast, accurate and reliable measurements of sample resistivity distribution. MicroXact’s four-point probes measure the average resistance of semiconductor wafers of layers by passing current through the outside points of a four-point probe and measuring the voltage across the inside points. The value of resistivity, […]
The MPS-C-300 and MPS-C-350 systems are the world’s first probe stations capable of immersing a sample in a fully controllable three dimensional magnetic field.
The Models SPS-2600-PLUS-VAC and 2800-PLUS-VAC offer precise, cost-efficient and convenient testing in vacuum or in controlled gas atmosphere.
MicroXact’s cryogenic probe stations enable cost effective, stable, reliable and convenient probing of devices and circuits at very low temperatures.
MicroXact’s cryomagnetic probe stations are available with electromagnets, superconducting magnets or combination of electromagnet and superconducting magnet.