Product

Semi-Auto Closed Cycle Cryogenic Probe Station

MicroXact semi-automated closed cycle cryogenic probe stations offer cost effective and fast wafer and device testing at cryogenic temperatures ideal for probing superconducting electronic devices and circuits.

High Temperature Probe Station

MicroXact high temperature probe stations offer wafer and device testing at highest temperature on the market in vacuum or controlled environment.

High-Speed Semi-Automated Systems

Motorized XY chuck, motorized platen in SPS-2600, motorized Z movement of the chuck in SPS 2800 in standard configuration. Motorized theta is an option. Servo motor-based, linear encoders. Very cost competitive, very fast, high productivity solution Highly recommended for medium scale production or other applications where throughput is important

High-Precision Semi-Automated Systems

  Motorized XY chuck, motorized Z movement of the chuck in standard configuration. Motorized theta is an option. Stepper motor-based, linear encoders. Cost competitive for the positioning specs. Ideal for low-volume production testing and chracterization.  

Standard Semi-Automated Systems

Motorized XY chuck, motorized platen in SPS-2600, motorized Z movement of the chuck in SPS 2800 in standard configuration. Motorized theta is an option. Stepper motor-based, no encoders. Very cost competitive Highly recommended in applications where sub-0°C testing or shielding is desired Options available: heated or cooled chucks, zoom scopes or compound microscopes, various shielding, […]

MicroXact Electrochemical Atomic Layer Deposition System (eALD)
Electrochemical Atomic Layer Deposition System (eALD)

The wafer-scale automated electrochemical Atomic Layer Deposition (eALD) system is an ideal tool to grow nanomaterials atomic layer by atomic layer by using surface limited chemical reactions (the phenomenon also known as an under potential deposition). Although similar to certain degree to more common vacuum Atomic Layer Deposition technique, eALD offers a number of unique […]

MicroXact IR Seebeck Characterization Systems
IR Seebeck Characterization Systems

The IR Seebeck Characterization Systems are capable of measuring the Seebeck coefficient and electrical resistivity of a wide range of samples. Common Seebeck characterization devices available from other companies are restricted to bridge-type in-plane samples or other limited geometries. MicroXact’s system allows you to measure cross-plane through thin-films and across complex 3D structures as well […]

MicroXact Nanomaterials
Nanomaterials

MicroXact, Inc. is offering a range of metal and metal oxide nanoparticles. Our unique synthesis and functionalization of metal nanoparticles provides highly stable, size- and shape-controlled nanoparticles, solvable in a wide range of solvents. Our synthesized and (optionally) functionalized metal oxide nanoparticles offer tight size distribution, solvability in a range of solvents and unique thermoelastic […]

MicroXact In-Line Thin Film Manufacturing Diagnostics Tool
In-Line Thin Film Manufacturing Diagnostics Tool

The In-Line Thin Film Manufacturing Diagnostics Tool is capable of characterizing the correlation of thin film manufacturing line to a known good sample in real time, for both defect detection and process control.

MicroXact All Optical Control of Magnetization
All Optical Control of Magnetization

All-Optical reconfigurable information processing: The team of MicroXact, Inc., UCLA, UC Irvine and Carnegie Mellon University is engineering revolutionary, nonvolatile reconfigurable plasmonic gates for information processing on the basis of ultrafast plasmon-enhanced all-optical magnetization switching. This unique approach allows one to program any gate between several different states at very high modulation rates and low […]

MicroXact Next Generation Thermoelectric Technology
Next Generation Thermoelectric Technology

Next generation thermoelectric devices: The team of MicroXact, Inc., Old Dominion University and Virginia Tech is developing a revolutionary, patent pending high efficiency thermoelectric material fabricated on completely new fabrication principles. The material comprises the three dimensional “wells” of semiconductor superlattices fabricated by a conformal coating via Atomic Layer Deposition (ALD) of macroporous silicon substrates. […]

MicroXact Cryogenic Thermometry System
Cryogenic Thermometry System

The team of MicroXact, Inc., JLab and Virginia Tech is developing a distributing fiber optic temperature mapping solution for Superconductive RF (SRF) cavity characterization. The solution will provide accurate, fast, reliable, EMI and radiation immune temperature mapping of superconducting cavities with very high sensor density, low cost per sensing point and ease of calibration, installation […]

Product Search